Mechanical Robust Biaxial MEMS Mirror Achieving >100° Optical Scanning Angle for LiDAR Application
Microelectromechanical system (MEMS) mirrors often face issues such as silicon material fracture during large-angle scanning. For MEMS devices with larger mirror sizes, due to the influence of air damping, the voltage amplitude is usually insufficient to drive the micromirror for large-angle scanning. This article designs a biaxial Lissajous scanning piezoelectric AlScN-driven MEMS micromirror driven by circular arc actuators, featuring large mirror with a diameter of 5 mm. To achieve large-angle scanning, optimizations are made in the following three aspects: 1) in order to reduce the risk of silicon material fracture during large-angle scanning, stress dispersion structures are adopted in the structural design and an improved non-Bosch process is utilized in the manufacturing process to achieve smooth sidewall morphology; 2) for achieving large-angle scanning of the large-size mirror at a lower voltage amplitude, vacuum packaging is employed in the packaging to reduce air damping; and 3) to find the resonant frequency under nonlinear effects, we utilize a frequency-sweeping driving method to actuate the MEMS mirror. After optimization, the mirror achieves total optical scanning angles (TOSAs) of 102.8° and 104.8° on its two axes. Furthermore, the mirror has passed 900 g shock tests and 20 g vibration tests, demonstrating its good shock and vibration resistance while achieving large scanning angles.
Authors
- Yonggui Zhang
- Hongfeng Zhao (ORCID: https://orcid.org/0000-0002-7036-127X)
- Hao Huang (ORCID: https://orcid.org/0009-0007-6428-5817)
- Xingwang Zhu
- Yongquan Su (ORCID: https://orcid.org/0000-0002-1116-8373)
- Zhenyu Wu (ORCID: https://orcid.org/0000-0002-0025-3521)
- Yang Wang
- Yichen Liu (ORCID: https://orcid.org/0000-0002-6681-5582)
- Lihao Wang (ORCID: https://orcid.org/0009-0003-1311-4023)
- Wenli Xue
- A.Z. Li (ORCID: https://orcid.org/0009-0004-5689-1858)
Institutions
- State Key Laboratory of Transducer Technology (CN)
- Shanghai Industrial Technology Institute (CN)
- Shanghai Institute of Microsystem and Information Technology (CN)
Publication Details
- Journal
- IEEE Sensors Journal
- Published
- 2024-12-19
- DOI
- https://doi.org/10.1109/jsen.2024.3517160
- Citations
- 5
- Primary Topic
- Advanced Measurement and Metrology Techniques
- Type
- article
- Field-Weighted Citation Impact
- 1.06
Funders
- National Key Research and Development Program of China