RELIABILITY ASSESSMENT OF ELECTRONIC COMPONENT BASE

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Published
2024-12-19
DOI
https://doi.org/10.34660/inf.2019.17.37520
Primary Topic
Manufacturing Process and Optimization
Type
article
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article

RELIABILITY ASSESSMENT OF ELECTRONIC COMPONENT BASE

Mikhail N. Piganov, D.V. Stolbinsky, A.A. Denisyuk
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Manufacturing Process and Optimization
article

RELIABILITY ASSESSMENT OF ELECTRONIC COMPONENT BASE

Mikhail N. Piganov, D.V. Stolbinsky, A.A. Denisyuk
article en

Abstract

No abstract available for this paper.
Samara University (ET)
Openalex Percentile: Top 66%
Manufacturing Process and Optimization
DOIOpen Access PDFOpenAlex
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RELIABILITY ASSESSMENT OF ELECTRONIC COMPONENT BASE — Mikhail N. Piganov, D.V. Stolbinsky, et al. · (2024) | TGRS Research Map | TGRS