Optimal design of accelerated test under electrical stress

The external working environment of electronic equipment is increasingly complex and diverse; especially the impact of electrical stress cannot be ignored. With functional circuit board of electronic equipment as the research object, an electrical stress type- power ripple of working environment is selected as accelerated stress on the basis of accelerated test under the stress of temperature, humidity, salt fog. The hardware design and implementation of electrical stress are given. Finally, accelerated test plan under electrical stress is optimized.