Study on Electrical and Temperature Characteristics of β-Ga2O3-Based Diodes Controlled by Varying Anode Work Function
This study systematically investigates the effects of anode metals (Ti/Au and Ni/Au) with different work functions on the electrical and temperature characteristics of β-Ga<sub>2</sub>O<sub>3</sub>-based Schottky barrier diodes (SBDs), junction barrier Schottky diodes (JBSDs) and P-N diodes (PNDs), utilizing Silvaco TCAD simulation software, device fabrication and comparative analysis. From the perspective of transport characteristics, it is observed that the SBD exhibits a lower turn-on voltage and a higher current density. Notably, the V<sub>on</sub> of the Ti/Au anode SBD is merely 0.2 V, which is the lowest recorded value in the existing literature. The V<sub>on</sub> and current trend of two types of PNDs are nearly consistent, confirming that the contact between Ti/Au or Ni/Au and NiO<sub>x</sub> is ohmic. A theoretical derivation reveals the basic principles of the different contact resistances and current variations. With the combination of SBD and PND, the V<sub>on</sub>, current density, and variation rate of the JBSD lie between those of the SBD and PND. In terms of temperature characteristics, all diodes can work well at 200 °C, with both current density and V<sub>on</sub> showing a decreasing trend as the temperature increases. Among them, the PND with a Ni/Au anode exhibits the best thermal stability, with reductions in V<sub>on</sub> and current density of 8.20% and 25.31%, respectively, while the SBD with a Ti/Au anode shows the poorest performance, with reductions of 98.56% and 30.73%. Finally, the reverse breakdown (BV) characteristics of all six devices are tested. The average BV values for the PND with Ti/Au and Ni/Au anodes reach 1575 V and 1550 V, respectively. Moreover, although the V<sub>on</sub> of the JBSD decreases to 0.24 V, its average BV is approximately 220 V. This work could provide valuable insights for the future application of β-Ga<sub>2</sub>O<sub>3</sub>-based diodes in high-power and low-power consumption systems.
Authors
- Guran Chen
- Baisong Sheng
- Yunlong He
- Peng Fei Liu (ORCID: https://orcid.org/0000-0003-0411-0488)
- Xiaoli Lu (ORCID: https://orcid.org/0000-0003-3689-5996)
- Xuefeng Zheng (ORCID: https://orcid.org/0000-0002-9410-3849)
- Ying Zhou (ORCID: https://orcid.org/0000-0001-9995-0652)
- Weiwei Chen (ORCID: https://orcid.org/0000-0001-7681-3962)
- H. J. Yang (ORCID: https://orcid.org/0009-0004-8274-9863)
- Xichen Wang (ORCID: https://orcid.org/0000-0002-3487-9012)
- Yue Hao (ORCID: https://orcid.org/0000-0001-8131-7509)
- Xiaohua Ma (ORCID: https://orcid.org/0000-0002-5546-8458)
- Lei Wang (ORCID: https://orcid.org/0000-0003-0734-7026)
Institutions
- Xidian University (CN)
- China Academy of Space Technology (CN)
Publication Details
- Journal
- Nanomaterials
- Published
- 2024-12-18
- DOI
- https://doi.org/10.3390/nano14242035
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Fundamental Research Funds for the Central Universities