On Anomalous Diffusion of Fast Electrons through the Silicon Crystal

Anomalous diffusion is a random process in which the root-mean-square displacement of a particle from the starting point depends nonlinearly on time. The possibility of such behavior for high-energy particles moving through the crystal under conditions close to axial channeling was found earlier. In this case, the rapid displacement of particles in a plane transverse to atomic strings (Lévi flights) is due to the temporary capture of the particles in planar channels. In this work, the anomalous diffusion exponent has been found by numerical simulation for different values of the energy of electron transverse motion in the (100) plane of a silicon crystal. It has been shown that, in the case of electrons with an energy exceeding by 1 eV the height of the saddle point of the potential of a system of atomic chains [100], the results are consistent with those obtained earlier. It has been confirmed that the anomalous nature of diffusion is due to the possibility of short-term capture of particles in planar channels. With increasing transverse energy, this possibility disappears and the diffusion becomes normal (Brownian).

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Publication Details

Journal
Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques
Published
2024-10-01
DOI
https://doi.org/10.1134/s1027451024700873
Primary Topic
Crystallography and Radiation Phenomena
Type
article
Field-Weighted Citation Impact
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article

On Anomalous Diffusion of Fast Electrons through the Silicon Crystal

A. I. Tarnovsky, В. В. Сыщенко, V. I. Dronik
Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques
Crystallography and Radiation Phenomena
article

On Anomalous Diffusion of Fast Electrons through the Silicon Crystal

A. I. Tarnovsky, В. В. Сыщенко, V. I. Dronik
article en

Abstract

Anomalous diffusion is a random process in which the root-mean-square displacement of a particle from the starting point depends nonlinearly on time. The possibility of such behavior for high-energy particles moving through the crystal under conditions close to axial channeling was found earlier. In this case, the rapid displacement of particles in a plane transverse to atomic strings (Lévi flights) is due to the temporary capture of the particles in planar channels. In this work, the anomalous diffusion exponent has been found by numerical simulation for different values of the energy of electron transverse motion in the (100) plane of a silicon crystal. It has been shown that, in the case of electrons with an energy exceeding by 1 eV the height of the saddle point of the potential of a system of atomic chains [100], the results are consistent with those obtained earlier. It has been confirmed that the anomalous nature of diffusion is due to the possibility of short-term capture of particles in planar channels. With increasing transverse energy, this possibility disappears and the diffusion becomes normal (Brownian).

Journal of Surface Investigation X-ray Synchrotron and Neutron TechniquesVol. 18(5)
Belgorod National Research University (RU)
Openalex Percentile: Top 86%
Crystallography and Radiation Phenomena
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