Analysis of Nanoscale Ferroelectric Domain Dynamics Based on Image Processing of Local C-V Maps

Local C-V mapping is a method to analyze and visualize the dynamics of polarization switching in ferroelectric materials with nanoscale resolution. This method uses a probe electrode to measure the butterfly-shaped C-V curve characteristic of ferroelectrics, and then repeats the measurement while scanning the probe to investigate the in-plane distribution. This method enables the acquisition of a large amount of measurement data reflecting the spatial distribution of domain switching characteristics in a short time. On the other hand, we are still searching for a method to analyze the huge amount of data and extract meaningful information from it. So far, we have attempted to analyze the data using unsupervised cluster analysis to classify each pixel into a pre-specified number of clusters based on the similarity of the C-V curve shape. This time, we introduced a different image processing method, more specifically, a differential filtering method, and attempted to extract information different from conventional methods.