Low-G Sensitivity Design and Implementation for Commercial Quartz Crystal Oscillators

This study investigates a low G-sensitivity AT-cut quartz oscillator design at 25 MHz that simply modifies the electrode's location of the conventional quartz oscillators to reduce the impact from environmental vibrations without changing the main structure of the resonator. The proposed design preserves the same production cost without sacrificing the oscillator performance. The main idea of this design is to relocate the main vibration area, where the thickness shear mode occurs, away from the anchor to reduce stress accumulation when external inertial force is applied to the device. When the electrode is positioned far from the anchor, the G-sensitivity averages 0.5 ppb/G, reflecting a 21.9% decrease compared to the conventional centered electrode design. As the electrode moves farther from the anchor, the accumulated stress has been decreased drastically and the overall G-sensitivity decreases, which indicates less impact from the external vibration.