Polarimetric analysis of whitefly larvae on pomegranate leaves via Mueller matrix imaging
This study explores the use of Mueller matrix imaging polarimetry (MMIP) to analyze whitefly larvae on a pomegranate leaf. Utilizing a dual-rotating retarder setup, we captured detailed Mueller matrix images of the infested leaf with whitefly larvae and after removing them. Through polar decomposition, we quantified depolarization, diattenuation, and retardance properties, providing insights into the structural and optical characteristics of the sample. The results indicate that the presence of larvae significantly alters the depolarization and retardance parameters, demonstrating the efficacy of MMIP in discerning fine structural and compositional changes in plant tissues.
Authors
- Saifollah Rasouli (ORCID: https://orcid.org/0000-0003-2703-8925)
- Mir Sajjad Hashemi (ORCID: https://orcid.org/0000-0002-5529-3125)
- Peyman Soltani (ORCID: https://orcid.org/0000-0002-7613-5134)
Institutions
- Leiden University (NL)
- Institute for Advanced Studies in Basic Sciences (IR)
Publication Details
- Journal
- Applied Optics
- Published
- 2024-12-18
- DOI
- https://doi.org/10.1364/ao.540802
- Citations
- 1
- Primary Topic
- Leaf Properties and Growth Measurement
- Type
- article
- Field-Weighted Citation Impact
- 0.60
Funders
- Iran National Science Foundation
- Institute for Advanced Studies in Basic Sciences