Analysis of nickel sulfoselenide materials by XPS
Metal chalcogenides are of interest as electrocatalysts, battery materials, and more. XPS is a valuable tool for studying changes to these materials before and after catalysis, making reference spectra for the pristine materials valuable. Here, we present XPS spectra for a family of nickel sulfoselenide (NiSSe) materials based on the Ni3X2 crystal structure, Ni3S2−xSex. XPS surveys and high-resolution spectra of Ni 2p, S 2p, S 2s, Se 3d, Se 3p, and Se 3s were recorded using Al Kα radiation.
Authors
- Bryan R. Wygant (ORCID: https://orcid.org/0000-0003-1924-7831)
- Samantha G. Rosenberg (ORCID: https://orcid.org/0000-0001-5033-5675)
- Melissa Meyerson (ORCID: https://orcid.org/0000-0001-9327-442X)
Institutions
- Sandia National Laboratories (US)
Publication Details
- Journal
- Surface Science Spectra
- Published
- 2024-12-01
- DOI
- https://doi.org/10.1116/6.0004063
- Citations
- 3
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.63
Funders
- U.S. Department of Energy
- National Nuclear Security Administration
- Office of Electricity
- Laboratory Directed Research and Development
- Sandia National Laboratories