SPICED: Syntactical Bug and Trojan Pattern Identification in A/MS Circuits using LLM-Enhanced Detection
Analog and mixed-signal (A/MS) integrated circuits (ICs) are crucial in modern electronics, playing key roles in signal processing, amplification, sensing, and power management. Many IC companies outsource manufacturing to third-party foundries, creating security risks such as stealthy analog Trojans. Traditional detection methods, including embedding circuit watermarks or conducting hardware-based monitoring, often impose significant area and power overheads, and may not effectively identify all types of Trojans. To address these shortcomings, we propose SPICED, a Large Language Model (LLM)-based framework that operates within the software domain, eliminating the need for hardware modifications for Trojan detection and localization. This is the first work using LLM-aided techniques for detecting and localizing syntactical bugs and analog Trojans in circuit netlists, requiring no explicit training and incurring zero area overhead. Our framework employs chain-of-thought reasoning and few-shot examples to teach anomaly detection rules to LLMs. With the proposed method, we achieve an average Trojan coverage of 93.32% and an average true positive rate of 93.4% in identifying Trojan-impacted nodes for the evaluated analog benchmark circuits. These experimental results validate the effectiveness of LLMs in detecting and locating both syntactical bugs and Trojans within analog netlists.
Authors
- Jayeeta Chaudhuri (ORCID: https://orcid.org/0000-0002-6738-805X)
- Farshad Firouzi (ORCID: https://orcid.org/0000-0002-8359-4304)
- Krishnendu Chakrabarty (ORCID: https://orcid.org/0000-0003-4475-6435)
- Arjun Chaudhuri (ORCID: https://orcid.org/0000-0001-9353-6397)
- Dhruv Thapar (ORCID: https://orcid.org/0009-0001-1050-0960)
Institutions
- Nvidia (United States) (US)
- Arizona State University (US)
Publication Details
- Published
- 2024-11-12
- DOI
- https://doi.org/10.1109/paine62042.2024.10792717
- Citations
- 12
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 2.50