Sub-pixel image registration method based on super-resolution reconstruction

Image registration is the process of geometric calibration of two or more images with overlapping areas of the same scene from different perspectives, different sensors or acquired at different times. This article focuses on the registration problem of sub-pixel displacement images in the process of super-resolution image reconstruction. Two sub-pixel image registration methods are introduced, including the spatial domain based feature matching SIFT registration method and the frequency domain based Vandewalle registration method. Four low resolution sequence images obtained through a micro scanning camera are used to simulate and analyze the registration accuracy of the two algorithms. The results show that both algorithms can achieve sub-pixel level registration of low resolution images.

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Published
2024-12-13
DOI
https://doi.org/10.1117/12.3046098
Primary Topic
Advanced Image Processing Techniques
Type
article
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article

Sub-pixel image registration method based on super-resolution reconstruction

Yanyan Liu, Yuping Du, Tongyu Liu
Advanced Image Processing Techniques
article

Sub-pixel image registration method based on super-resolution reconstruction

Yanyan Liu, Yuping Du, Tongyu Liu
article en

Abstract

Image registration is the process of geometric calibration of two or more images with overlapping areas of the same scene from different perspectives, different sensors or acquired at different times. This article focuses on the registration problem of sub-pixel displacement images in the process of super-resolution image reconstruction. Two sub-pixel image registration methods are introduced, including the spatial domain based feature matching SIFT registration method and the frequency domain based Vandewalle registration method. Four low resolution sequence images obtained through a micro scanning camera are used to simulate and analyze the registration accuracy of the two algorithms. The results show that both algorithms can achieve sub-pixel level registration of low resolution images.

National Engineering Research Center of Electromagnetic Radiation Control Materials (CN)
Openalex Percentile: Top 77%
Advanced Image Processing Techniques
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