Machine Learning-based feasibility estimation of digital blocks in BCD technology

Analog-on-Top Mixed Signal (AMS) Integrated Circuit (IC) design is a time-consuming process predominantly carried out by hand. Within this flow, usually, some area is reserved by the top-level integrator for the placement of digital blocks. Specific features of the area, such as size and shape, have a relevant impact on the possibility of implementing the digital logic with the required functionality. We present a Machine Learning (ML)-based evaluation methodology for predicting the feasibility of digital implementation using a set of high-level features. This approach aims to avoid time-consuming Place-and-Route trials, enabling rapid feedback between Digital and Analog Back-End designers during top-level placement.

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Publication Details

Published
2024-10-14
DOI
https://doi.org/10.1109/dttis62212.2024.10780062
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
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article

Machine Learning-based feasibility estimation of digital blocks in BCD technology

Francesco Daghero, Michelangelo Grosso, Giovanna Antonella Franchino, Daniele Jahier Pagliari et al.
Industrial Vision Systems and Defect Detection
article

Machine Learning-based feasibility estimation of digital blocks in BCD technology

Francesco Daghero, Michelangelo Grosso, Giovanna Antonella Franchino, Daniele Jahier Pagliari, Gabriele Faraone, Dario Licastro, Eugenio Serianni, Nicola Di Carolo
article en

Abstract

Analog-on-Top Mixed Signal (AMS) Integrated Circuit (IC) design is a time-consuming process predominantly carried out by hand. Within this flow, usually, some area is reserved by the top-level integrator for the placement of digital blocks. Specific features of the area, such as size and shape, have a relevant impact on the possibility of implementing the digital logic with the required functionality. We present a Machine Learning (ML)-based evaluation methodology for predicting the feasibility of digital implementation using a set of high-level features. This approach aims to avoid time-consuming Place-and-Route trials, enabling rapid feedback between Digital and Analog Back-End designers during top-level placement.

Politecnico di Torino (IT), STMicroelectronics (Italy) (IT)
Openalex Percentile: Top 66%
Industrial Vision Systems and Defect Detection
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Machine Learning-based feasibility estimation of digital blocks in BCD technology — Francesco Daghero, Michelangelo Grosso, et al. · (2024) | TGRS Research Map | TGRS