Research and implementation of EBCMOS non-uniform correction algorithm based on FPGA
Because of the non-uniform response generated during the development of EBCMOS( Electron Bombardment Complementary Metal Oxide Semiconductor), the images with non-uniform stripe noise is outputted by EBCMOS in low light environment, which seriously reduces the imaging quality of EBCMOS and has become an urgent problem to be solved. To solve this problem, the reason of stripe noise generation is analyzed, the image processing algorithm based on least squares linear correction model is implemented on FPGA, and the experimentation is completed. According to the result of experiment, this algorithm can eliminate the stripe noise of EBCMOS, and the non-uniformity of the processed image is reduced by almost 75% compared to the pre-processed image, the correction effect is fine.
Authors
- X. Yuan (ORCID: https://orcid.org/0000-0003-0468-3083)
- Ye Yang (ORCID: https://orcid.org/0000-0002-1135-4643)
- Yulong Wang (ORCID: https://orcid.org/0000-0003-1619-2265)
- Xuhong Li
- Zheng Zhou (ORCID: https://orcid.org/0009-0002-0298-1642)
- Ke Si (ORCID: https://orcid.org/0009-0001-6099-644X)
- Jiayin Liu (ORCID: https://orcid.org/0000-0001-7554-9661)
- Gangcheng Jiao
Institutions
- Institute of Physics (CN)
Publication Details
- Published
- 2024-12-13
- DOI
- https://doi.org/10.1117/12.3048040
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00