Study on the microstructure and optical properties of PbTe films prepared by magnetron sputtering

We present a Si-based Photodetector with a broadband and fast response based on Lead telluride (PbTe) polycrystalline films prepared by magnetron sputtering technique. The prepared PbTe films are polycrystalline and the dominant surface is (111) plane. The best films have triangular morphology. The atomic ratio of Pb/Te tends to 1:1. The photoelectric property detection results show that the films deposited at 130 W for 10 minutes at room temperature have excellent properties. The fastest rise time and fall time of near infrared band can reach 900 microseconds and 700 microseconds respectively, and the longest detection band can reach 4.1 microns.