Research on automated test system for performance parameters of InGaAs PIN focal plane detectors

Accurate and efficient focal plane testing is the basis for evaluating Infrared focal plane arrays(IRFPA). In this paper, an all-in-one test system is developed to accurately and efficiently evaluate the performance of focal plane devices and ensure reliability in practical applications for short-wave infrared focal plane devices from 900 nm to 1700 nm. The all-in-one machine is paired with software, the test data is automatically exported. Through the test and verification of an InGaAs PIN focal plane detector, the key data such as responsivity, photoresponse non-uniformity(PRNU), responsivity and quantum efficiency were obtained, and the test results were given and analyzed. At the same time, the influence of temperature on the dark current is tested. The ambient temperature of -20°C to 30°C is suitable for the device. The experimental results practice the effectiveness of the test system.