Improving the Reliability of Interconnection Networks Using Replicated 4-Disjoint GIN

Today, high-performance computing is recognized as a necessity in various industries. The stable and secure connection between system components, such as CPUs and memories, requires efficient, reliable, and fault-tolerant networks. Multistage Interconnection Networks (MIN) are fundamental approaches to create such an interconnection facility among researchers and engineers. Meanwhile, the Gamma Interconnection Network (GIN) provides one of the highest levels of fault tolerance networks among MINs by establishing multiple paths. Considering the importance of disjoint paths, 4-Disjoint GIN (4DGIN) has been developed, which is an important type of GIN and provides four disjoint paths for all source–destination pairs. On the other hand, the replication approach improves network fault tolerance, which directly affects network reliability. In this paper, a replicated 4DGIN is proposed, enhancing the reliability and improving the fault-tolerance factor by creating disjoint and redundant paths. The reliability of the proposed network is evaluated using the Reliability Block Diagram (RBD) approach. The reliability evaluation results show that the proposed network outperforms several well-known MINs, such as different variations of SEN and Benes networks in terms of the terminal, broadcast, and network reliability factors. Moreover, it improves the cost per unit factor in comparison with the baselines.