Auto-Trimming-Based Designs for the Test Optimization of Mass-Produced Automotive Microcontroller Unit Chip Probing Tests

High-voltage and analog measurements occupy a large amount of automated test equipment (ATE) overhead. A method for realizing trimming automation through mixed digital and analog circuits is proposed. Taking a 40 nm 1 MB Flash chip test as an example, current high-voltage and analog quantity trimming accounts for 6.9% of the total test time. Through adding digital and analog circuits to the Built-In Self-Test (BIST) circuit, the trimming test time is reduced from 2.94 s to 0.23 s, and the ratio of the total test time is reduced to 0.58%. Compared with the original chip probing (CP) total time, the total time is reduced by 6.35%, the ATE overhead accounts for 19.35% of the total test time, and the Flash area is 0.63%. The measurement accuracy reaches 750 μV~6 mV, and the measurement error is 0.15% ± 7 mV, compared with the conventional ATE trimming method.