The Alphabet Soup of Microscopy: An Introduction to Advanced Imaging Techniques. Part III: A Combo Platter of CLEM, AFM, TIRF, SPIM, and TPEF-SHG

Abstract The practice of combining imaging modalities emerged from the quest to discover novel insights into the structure and function of various samples. As these techniques merge, so do their names, creating a plethora of unique acronyms that can seem like an alphabet soup. Highlighted here are several notable combination techniques such as Correlative Light and Electron Microscopy (CLEM), Atomic Force Microscopy (AFM), Total Internal Reflection Fluorescence (TIRF), Selective Plane Illumination Microscopy (SPIM), and Two-Photon Excited Fluorescence – Second Harmonic Generation (TPEF-SHG). Each of these methods extends beyond the capabilities of their individual components to significantly advance scientific research. This article, Part 3 of our “Alphabet Soup of Microscopy” series, seeks to distinguish these popular combination techniques from their standalone predecessors.