Construction and implementation of single substrate for multiparameter surface acoustic wave measurement sensor

Based on measuring principle of surface acoustic wave(saw) technology, the paper introduces saw delay line and SAW-RFID sensor associated with demand for multiple parameter measurement. Presents single chip structure based saw delay line for multiple parameter test and further with focus on discussing interpretation method of time series obtained from transformation of reflection coefficient of sweeping frequency measures. Sweeping bandwidth and FFT data length are discussed as crucial for obtaining clear reflection peaks on time domain plots. Finally, experienced specification which suggests designing single SAW substrate is presented.