On measuring the number of passes of electrons through thin internal targets of a betatron
Abstract The results of testing the method for measuring the number of passes of the betatron electron beam through a thin internal target are presented. The method is based on comparing the intensity of the characteristic X-ray radiation (CXR) emitted by a “thin” and “thick single-pass” targets.
Authors
- A. V. Vukolov
- M. V. Shevelev (ORCID: https://orcid.org/0000-0001-5417-3132)
- S. R. Uglov
Institutions
- National Research Tomsk State University (RU)
- Tomsk Polytechnic University (RU)
Publication Details
- Journal
- Journal of Physics Conference Series
- Published
- 2024-12-01
- DOI
- https://doi.org/10.1088/1742-6596/2924/1/012010
- Primary Topic
- Nuclear Physics and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00