Research on a non-contact measurement method of single wires based on wavelet denoising

With the development of modern industry and science and technology, the traditional monofilament diameter measuring technology has been unable to meet the measurement requirements of the high precision and wide applicable range. And the ultra-high precision filament measuring instrument is very harsh to its working conditions. Therefore, it is of great theoretical and engineering significance to develop a high-precision, wide-measuring range and fast-measured wire diameter measurement system that can be used in actual industrial production. With the rapid development of optoelectronic science and technology and signal processing technology, charge-coupled devices (CCD) and digital signal processing technology have been widely used in the field of non-contact diameter measurement. This paper is based on projection imaging technology to magnify the filament projection to the linear CCD photosensitive surface Sensing the photoelectric signal, collecting the signal through the embedded system, and finally using the mean filtering, wavelet noise reduction and quadratic curve fitting technology to optimize the measured signal, so as to realize the fast and efficient measurement of the diameter of the filament.