Voltage controls spin reorientation transition in TmFeO3 thin films
We present a study on the voltage control of the spin reorientation transition in TmFeO<sub>3</sub> thin films grown on PMN-PT ferroelectric substrates. Notably, we demonstrate the ability to manipulate the temperature range of this transition using an applied voltage. As the voltage increases, there is a gradual expansion of the temperature range associated with spin reorientation transition. The observed changes could be attributed to the strain-induced modifications in ion coupling strength within the TmFeO<sub>3</sub> thin film. These significant findings lay a solid foundation and offer a promising prospect for designing spintronic devices.
Authors
- Lichuan Jin (ORCID: https://orcid.org/0000-0002-9398-3565)
- Lei Zhang (ORCID: https://orcid.org/0000-0003-4998-3389)
Institutions
- University of Electronic Science and Technology of China (CN)
Publication Details
- Published
- 2024-12-12
- DOI
- https://doi.org/10.1117/12.3050368
- Primary Topic
- Multiferroics and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00