Optimizing Search Testing Method for Brake Boost Degradation Based on Electrical Chassis System M-HIL Bench

<div class="section abstract"><div class="htmlview paragraph">With the technology of electronic chassis control systems of automobile is widely used, the functional interaction between brake system and the other electronic systems may lead to brake boost degradation. Therefore, it is necessary to find out brake boost degradation events in the quite large number of driving scenarios. To solve the difficulty of thoroughly and quickly searching for brake boost degradation conditions in the large number of driving scenarios, based on Mechatronic-Hardware-In-the-Loop (M-HIL) technology, this paper constructs an electrical chassis system M-HIL bench to verify the function and performance of the electronic brake control system under actual chassis system conditions. To search and locate the brake boost degradation conditions rapidly and enhance the searching efficiency of levels boundary of affecting factors for brake boost degradation, firstly, based on pair-wise coverage combinatorial testing, brake boost degradation occurrence rate is estimated and initial level combinations including brake boost degradation events are calculated by conducting the brake boost degradation single test of all test cases automatically. Secondly, if the brake boost degradation occurrence rate exceeds the threshold of occurrence rate, based on particle swarm optimization (PSO) algorithm and islet cases expansion, levels boundary of affecting factors for brake boost degradation is searched by execution of automatic testing program. The optimizing search testing method proposed in this paper, which combines pair-wise coverage combinatorial testing theory with PSO, can enhance testing efficiency for electronic brake control system. In addition, the scenario coverage of brake boost degradation events can also be increased by expanding islet cases.</div></div>