A Low Switching Loss 4H-SiC Superjunction MOSFET Design
In this paper, a 4H-SiC dual-trench metal-oxide-semiconductor field effect transistor with shielded-gate and superjunction (DT/SJ-SGTMOS) is proposed. Due to the shielded gate structure at the gate trench, the gate-drain overlap area of the device is reduced. The switching speed of the device is improved. In addition, the P-pillar and the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathrm{N}^{+}$</tex>-drift form a superjunction structure, which reduces the specific on-resistance <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(R_{\text{on},\text{sp}})$</tex> and improves the breakdown voltage (BV). Compared with 4H-SiC superjunction dual-trench MOSFET (DT-SJMOS), the DT/SJ-SGTMOS has higher BV, faster switching speed, and superior dynamic and static performance.
Authors
- Xinkai Chen (ORCID: https://orcid.org/0000-0001-7381-9760)
- Yuan He (ORCID: https://orcid.org/0000-0002-4087-8905)
- Haoran Wu (ORCID: https://orcid.org/0000-0003-0623-0176)
- Shiguang Shang
Institutions
- Xi’an University of Posts and Telecommunications (CN)
Publication Details
- Published
- 2024-08-23
- DOI
- https://doi.org/10.1109/isset62871.2024.10779940
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00