Effect Mechanism of Dynamic Avalanche on Turn-Off Behavior and Ruggedness of IGCT
By analytical analysis and TCAD device simulation, the physical mechanisms behind the dynamic avalanche and resulting current filament during IGCT turn-off are revealed. It is demonstrated that dynamic avalanche can greatly increase the turn-off time and loss of the device, and with the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\alpha_{pnp}$</tex> increasing, the avalanche-generated current filament becomes stronger and moves slower, which will weaken the ruggedness of the device at the turn-off.
Authors
- Sen Wang (ORCID: https://orcid.org/0009-0003-4968-9566)
- Wuhua Yang (ORCID: https://orcid.org/0000-0003-4025-9087)
- Chao Xiao (ORCID: https://orcid.org/0000-0003-1793-6983)
- Yiwei Lu (ORCID: https://orcid.org/0000-0002-0176-5289)
- Jia‐Tao Zhang (ORCID: https://orcid.org/0000-0003-4302-9332)
- Chaofeng Zhang (ORCID: https://orcid.org/0000-0003-1045-202X)
- Manling Dong (ORCID: https://orcid.org/0000-0002-0191-183X)
Institutions
- Xi'an University of Technology (CN)
Publication Details
- Published
- 2024-08-23
- DOI
- https://doi.org/10.1109/isset62871.2024.10779752
- Primary Topic
- Engineering Applied Research
- Type
- article
- Field-Weighted Citation Impact
- 0.00