Toward TSV-Compatible Microfluidic Cooling for 3D ICs
Cooling presents a significant challenge for high-performance 3-D integrated circuits (3D ICs). To this end, this research explores through-silicon via (TSV)-compatible micropin-fin heat sink (MPFHS) for high-power 3-D chip stacks. Copper TSVs with a diameter of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$5.2~\mu $ </tex-math></inline-formula>m and a high aspect ratio (HAR) of 29:1 are developed. An extensive experimental and computational investigation of the MPFHS under varying flow rates and power conditions was conducted, showing that the MPFHS maintains an average chip temperature below <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$72~^{\circ }$ </tex-math></inline-formula>C, even with a total power dissipation of 500 W and a power density of 312 W/cm2 at a flow rate of 117 mL/min. The minimum total thermal resistance achieved was <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$0.286~^{\circ }$ </tex-math></inline-formula>C<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\cdot $ </tex-math></inline-formula>cm2/W.
Authors
- Yogendra Joshi (ORCID: https://orcid.org/0000-0002-8815-5212)
- Husam A. Alissa (ORCID: https://orcid.org/0000-0001-5018-2605)
- Christian Belady
- Vaidehi Oruganti
- Muhannad S. Bakir (ORCID: https://orcid.org/0000-0002-0380-0842)
- Bharath Ramakrishnan (ORCID: https://orcid.org/0000-0002-2858-3557)
- Muneeb Zia (ORCID: https://orcid.org/0000-0001-7734-5670)
- Shane Oh (ORCID: https://orcid.org/0000-0003-3867-9410)
- Erik W. Masselink
- Euichul Chung (ORCID: https://orcid.org/0000-0001-7602-5069)
- Geyu Yan
- Yunhyeok Im
Institutions
- Microsoft (United States) (US)
- Georgia Institute of Technology (US)
- Vantage View (United States) (US)
Publication Details
- Journal
- IEEE Transactions on Components Packaging and Manufacturing Technology
- Published
- 2024-12-12
- DOI
- https://doi.org/10.1109/tcpmt.2024.3516653
- Citations
- 11
- Primary Topic
- 3D IC and TSV technologies
- Type
- article
- Field-Weighted Citation Impact
- 2.30
Funders
- Microsoft