Feasibility study on measuring jitter of moving plane with dial indicator
In the process of installation and debugging in the industrial field, it is worth exploring whether the micrometer can be used to replace the high-precision sensors and supporting equipment to measure the amount of jitter of the motion plane. By splitting the micrometer, measuring, simplifying, building a simulation in ADAMS, designing a test scheme according to the scene of LCD panel inspection, and carrying out experimental research and data analysis and processing at different speeds, the results show that the micrometer is capable of measuring the plane jitter of LCD panel production equipment within a certain moving speed. This study provides a feasible basis for the use of micrometers for measurements under mobile conditions, which can significantly reduce the cost of enterprises.
Authors
- Zeshun Wang
- Lixin Wang (ORCID: https://orcid.org/0000-0001-5398-6860)
- X. Chen (ORCID: https://orcid.org/0009-0005-5119-8111)
Institutions
- Zhengzhou University (CN)
- MD Precision (Canada) (CA)
Publication Details
- Published
- 2024-12-12
- DOI
- https://doi.org/10.1117/12.3055353
- Primary Topic
- Advanced Measurement and Detection Methods
- Type
- article
- Field-Weighted Citation Impact
- 0.00