Dielectric nonlinearity analysis of BNT–ST–BT relaxor ferroelectric thin films with different film thicknesses
Thickness-dependent dielectric nonlinear properties of 0.78Bi0.5Na0.5TiO3–0.2SrTiO3–0.02BaTiO3 thin films in a thickness range of 0.62–1.62 μm were investigated in this work. It was demonstrated that the dielectric properties decreased with the decrease in thickness due to the substrate clamping inducing the degeneration of intrinsic contribution and the reduced domain wall mobility. A low DC electric field promoted domain switching and reversible domain wall motion. The domain mobility was suppressed by a high DC electric field, which resulted in reduced dielectric permittivity combined with the tunability of intrinsic dielectric response.
Authors
- Yuanlin Li (ORCID: https://orcid.org/0009-0008-7604-4153)
- Kun Zheng (ORCID: https://orcid.org/0000-0002-8866-464X)
- Wei Ren (ORCID: https://orcid.org/0000-0001-9749-0699)
- Jinyan Zhao (ORCID: https://orcid.org/0000-0002-4336-4352)
- Haoyan Meng (ORCID: https://orcid.org/0000-0003-4653-4844)
- Jie Zhang (ORCID: https://orcid.org/0000-0003-3472-2274)
- Zhe Wang (ORCID: https://orcid.org/0000-0002-8766-6811)
- Yulong Zhao
- Gang Niu (ORCID: https://orcid.org/0000-0002-8813-8885)
- Nan Zhang (ORCID: https://orcid.org/0000-0002-8515-429X)
Institutions
- Liaocheng University (CN)
- Xi'an Jiaotong University (CN)
Publication Details
- Journal
- Journal of Applied Physics
- Published
- 2024-12-11
- DOI
- https://doi.org/10.1063/5.0231329
- Citations
- 2
- Primary Topic
- Ferroelectric and Piezoelectric Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.23
Funders
- National Natural Science Foundation of China