FPGA Technology Mapping With Adaptive Gate Decomposition

FPGA technology mapping is an extensively studied problem. There is functional decomposition as well as graph covering-based approaches. For efficiency consideration, most existing algorithms are graph covering-based. However, logic synthesis can affect the graph covering results significantly. In this article, we propose an FPGA mapping algorithm with gate decomposition. Bin-packing is used to generate gate decompositions during mapping to avoid the decomposition choice pregeneration problem in existing approaches. Our results show that our algorithm can get an average of 13% area reduction over the state-of-the-art lossless synthesis-based mapping algorithm in ABC. When compared with industrial tool Vivado, we can get a significant area reduction of 35% on average.

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Publication Details

Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Published
2024-12-11
DOI
https://doi.org/10.1109/tcad.2024.3515876
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

FPGA Technology Mapping With Adaptive Gate Decomposition

Chang Wu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
VLSI and Analog Circuit Testing
article

FPGA Technology Mapping With Adaptive Gate Decomposition

Chang Wu
article en

Abstract

FPGA technology mapping is an extensively studied problem. There is functional decomposition as well as graph covering-based approaches. For efficiency consideration, most existing algorithms are graph covering-based. However, logic synthesis can affect the graph covering results significantly. In this article, we propose an FPGA mapping algorithm with gate decomposition. Bin-packing is used to generate gate decompositions during mapping to avoid the decomposition choice pregeneration problem in existing approaches. Our results show that our algorithm can get an average of 13% area reduction over the state-of-the-art lossless synthesis-based mapping algorithm in ABC. When compared with industrial tool Vivado, we can get a significant area reduction of 35% on average.

IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsVol. 44(6)
Fudan University (CN), Shanghai Fudan Microelectronics (China) (CN)
Openalex Percentile: Top 76%
VLSI and Analog Circuit Testing
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