Schottky-MIS Cascode Drain Reverse-Blocking p-GaN Gate Transistor With Significantly Reduced Forward Drop and Ultralow Leakage Current
In this article, we experimentally propose a reverse-blocking (RB) p-GaN gate transistor with the Schottky-MIS cascode drain (CDT) for the significantly reduced forward voltage drop <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${\textit {V}}_{\mathbf {F}}$ </tex-math></inline-formula> and ultralow reverse leakage current <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\mathbf {\textit {LEAK}}}$ </tex-math></inline-formula>. At forward bias, electron concentration at the Schottky-MIS cascode drain is higher than that at conventional p-GaN/Ohmic drain. When experiencing reverse bias, the Schottky-MIS cascode drain effectively protects the Schottky contact from the high reverse potential compared to Schottky drain. The fabricated Schottky-MIS CDT presents a superior <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\mathbf {F}}$ </tex-math></inline-formula> - <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\mathbf {\textit {LEAK}}}$ </tex-math></inline-formula> relationship including a greatly reduced <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\mathbf {F}}$ </tex-math></inline-formula> of 3.1V as well as an ultralow <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I}_{\mathbf {\textit {LEAK}}}$ </tex-math></inline-formula> of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${1}\times {10} ^{-{8}}$ </tex-math></inline-formula> A/mm, together with a competitive reverse power figure-of-merit (FOM) of 120MW/cm2. These performances suggest that the proposed Schottky-MIS CDT can be a promising candidate for low-loss RB GaN power transistors and applications requiring a better <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\mathbf {F}}$ </tex-math></inline-formula> - <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${I} _{\mathbf {\textit {LEAK}}}$ </tex-math></inline-formula> trade-off.
Authors
- Ping Yu
- Zeheng Wang (ORCID: https://orcid.org/0000-0002-6994-1234)
- Xinghuan Chen (ORCID: https://orcid.org/0000-0002-8294-1730)
- Cheng Yu (ORCID: https://orcid.org/0000-0002-3883-4858)
- Wanjun Chen (ORCID: https://orcid.org/0000-0002-8398-4548)
- Zhuocheng Wang (ORCID: https://orcid.org/0000-0001-9535-2727)
- Bo Zhang (ORCID: https://orcid.org/0000-0003-1288-1549)
- Xiaoliang Wang (ORCID: https://orcid.org/0000-0001-7820-4706)
- Xiaohui Wang (ORCID: https://orcid.org/0000-0002-1442-8732)
- Yang Wang (ORCID: https://orcid.org/0000-0001-8873-5957)
- Hong Chen (ORCID: https://orcid.org/0000-0003-4283-6095)
- Haiqiang Jia (ORCID: https://orcid.org/0000-0003-1919-9403)
- Guojian Ding (ORCID: https://orcid.org/0009-0008-9685-935X)
- Chang Gao (ORCID: https://orcid.org/0000-0002-8130-1854)
- Fangzhou Wang (ORCID: https://orcid.org/0000-0001-5000-2133)
- Qi Feng (ORCID: https://orcid.org/0009-0003-3496-1619)
Institutions
- University of Electronic Science and Technology of China (CN)
- Southern University of Science and Technology (CN)
- China Electronic Product Reliability and Environmental Test Institute (CN)
- Songshan Lake Materials Laboratory (CN)
- CSIRO Manufacturing (AU)
Publication Details
- Journal
- IEEE Electron Device Letters
- Published
- 2024-12-11
- DOI
- https://doi.org/10.1109/led.2024.3515211
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China