MORPHOLOGICAL INSIGHTS OF CARBON NANOMATERIALS USING ATOMIC FORCE MICROSCOPY AND THEIR APPLICATIONS

This paper reviews the application of atomic force microscopy (AFM) in analyzing the nanoscale morphological properties of key carbon nanomaterials: carbon nanotubes (CNTs), graphene, and fullerene. AFM imaging techniques, operating at sub-nanometer resolutions of approximately 0.5 nm, are utilized to evaluate surface topography, roughness, and dimensional attributes. CNTs exhibit diameters ranging from 1[Formula: see text]nm to 10[Formula: see text]nm, with surface roughness correlating to their mechanical strength, reported to exceed 50[Formula: see text]GPa. For graphene, AFM measurements confirm a monolayer thickness of ∼0.34[Formula: see text]nm, while defects such as wrinkles and grain boundaries are identified, which significantly influence its exceptional thermal conductivity of up to 5000 W/mK. Fullerene structures, characterized by their spherical morphology and uniform diameters averaging 0.7[Formula: see text]nm, demonstrate superior dispersion in composite matrices. The review further explores the synergistic effects and trade-offs in utilizing these nanomaterials as fillers in composite systems. For instance, graphene improves electrical conductivity by over 200% in polymer composites, while CNTs contribute significantly to mechanical reinforcement, and fullerene enhances chemical stability and compatibility in biomedical applications. Through comparative analysis, the paper identifies pathways to optimize filler performance through tailored dispersion and functionalization. These insights serve as a foundation for future innovations in nanomaterial-enhanced composites across industries.

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Publication Details

Journal
Surface Review and Letters
Published
2024-12-11
DOI
https://doi.org/10.1142/s0218625x25300096
Citations
5
Primary Topic
Force Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
1.69
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article

MORPHOLOGICAL INSIGHTS OF CARBON NANOMATERIALS USING ATOMIC FORCE MICROSCOPY AND THEIR APPLICATIONS

John Britto, K. Amudhan, Senthil Maharaj Kennedy, G. R. Raghav
5 citations
Surface Review and Letters
Force Microscopy Techniques and Applications
1.69
article

MORPHOLOGICAL INSIGHTS OF CARBON NANOMATERIALS USING ATOMIC FORCE MICROSCOPY AND THEIR APPLICATIONS

John Britto, K. Amudhan, Senthil Maharaj Kennedy, G. R. Raghav
article en
5 citations

Abstract

This paper reviews the application of atomic force microscopy (AFM) in analyzing the nanoscale morphological properties of key carbon nanomaterials: carbon nanotubes (CNTs), graphene, and fullerene. AFM imaging techniques, operating at sub-nanometer resolutions of approximately 0.5 nm, are utilized to evaluate surface topography, roughness, and dimensional attributes. CNTs exhibit diameters ranging from 1[Formula: see text]nm to 10[Formula: see text]nm, with surface roughness correlating to their mechanical strength, reported to exceed 50[Formula: see text]GPa. For graphene, AFM measurements confirm a monolayer thickness of ∼0.34[Formula: see text]nm, while defects such as wrinkles and grain boundaries are identified, which significantly influence its exceptional thermal conductivity of up to 5000 W/mK. Fullerene structures, characterized by their spherical morphology and uniform diameters averaging 0.7[Formula: see text]nm, demonstrate superior dispersion in composite matrices. The review further explores the synergistic effects and trade-offs in utilizing these nanomaterials as fillers in composite systems. For instance, graphene improves electrical conductivity by over 200% in polymer composites, while CNTs contribute significantly to mechanical reinforcement, and fullerene enhances chemical stability and compatibility in biomedical applications. Through comparative analysis, the paper identifies pathways to optimize filler performance through tailored dispersion and functionalization. These insights serve as a foundation for future innovations in nanomaterial-enhanced composites across industries.

Surface Review and Letters
General Hospital Ernakulam (IN), ASA College (US)
Openalex Percentile: Top 15%
Force Microscopy Techniques and Applications
1.69
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