Inhomogeneous Resistivity of Transparent Superconductor Films Revealed by the Van Der Pauw Technique
Detection of structural and transport inhomogeneities in superconducting thin films using the standard four-probe method requires multiple measurements and may be inaccurate.A new approach to extract the information about the inhomogeneous transition into the superconducting state using van der Pauw technique is presented.The proposed method is applied to an elec-
Authors
- M. Gregor (ORCID: https://orcid.org/0000-0001-7313-2563)
- E. Zhitlukhina
- A. Parra (ORCID: https://orcid.org/0000-0001-8327-6018)
- A. M. Aliev (ORCID: https://orcid.org/0000-0002-7765-5692)
- V. Shamaev
- A. P. Shapovalov (ORCID: https://orcid.org/0000-0002-2181-9416)
- D. Menesenko (ORCID: https://orcid.org/0000-0001-7270-4339)
- T. Pleceník (ORCID: https://orcid.org/0000-0002-6518-052X)
Publication Details
- Journal
- METALLOFIZIKA I NOVEISHIE TEKHNOLOGII
- Published
- 2024-12-10
- DOI
- https://doi.org/10.15407/mfint.46.06.0517
- Citations
- 2
- Primary Topic
- Surface and Thin Film Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.68
Funders
- Univerzita Komenského v Bratislave
- Agentúra na Podporu Výskumu a Vývoja
- European Regional Development Fund