AN APPROACH FOR THICKNESS ESTIMATION OF ANODIZED TITANIUM OXIDE USING DIGITAL CAMERA

This paper presents a novel approach for estimating the thickness of anodized titanium oxide layers using digital imaging and thin film interference principles. Traditional methods for thin film thickness measurement, such as ellipsometry and X-ray reflectivity, offer high precision but can be costly and complex. In contrast, the proposed technique leverages the correlation between oxide layer thickness and the interference colors observed in anodized titanium surfaces. Using a digital camera, images of the anodized samples are captured under controlled lighting conditions, followed by color calibration and analysis. Specialized software then interprets the interference patterns to estimate oxide thickness. This method provides a non-destructive, cost-effective, and accessible alternative for thickness measurement, with potential applications in quality control and material characterization across industries such as aerospace and biomedical devices.