12b 500MS/s successive‐approximation‐register‐assisted pipeline analogue‐to‐digital convertor using a four‐stage ring amplifier with coarse‐analogue‐to‐digital convertor embedded

Abstract This article presents a 12b 500MS/s successive‐approximation‐register‐assisted pipeline analogue‐to‐digital converter. By adopting a new auto‐zero scheme, a calibration‐free four‐stage ring residue amplifier with a small offset cancellation capacitor is proposed. In addition, the coarse‐analogue‐to‐digital converter of the second stage is embedded into the amplification phase, which relaxes the comparison periods of the first and second stages by 25.0% and 17.4%, respectively. Post‐simulated in 28‐nm CMOS technology with a 0.9 V supply, the analogue‐to‐digital converter achieves 62.2 dB SNDR and 78.1 dB SFDR. It consumes 8.45 mW with an on‐chip reference voltage buffer, resulting in Schreier's figure of merit (FoM S ) of 166.9 dB.

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Publication Details

Journal
Electronics Letters
Published
2024-12-01
DOI
https://doi.org/10.1049/ell2.70101
Primary Topic
Analog and Mixed-Signal Circuit Design
Type
article
Field-Weighted Citation Impact
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article

12b 500MS/s successive‐approximation‐register‐assisted pipeline analogue‐to‐digital convertor using a four‐stage ring amplifier with coarse‐analogue‐to‐digital convertor embedded

Junyan Ren, Fan Ye, Linghao Liu
Electronics Letters
Analog and Mixed-Signal Circuit Design
article

12b 500MS/s successive‐approximation‐register‐assisted pipeline analogue‐to‐digital convertor using a four‐stage ring amplifier with coarse‐analogue‐to‐digital convertor embedded

Junyan Ren, Fan Ye, Linghao Liu
article en

Abstract

Abstract This article presents a 12b 500MS/s successive‐approximation‐register‐assisted pipeline analogue‐to‐digital converter. By adopting a new auto‐zero scheme, a calibration‐free four‐stage ring residue amplifier with a small offset cancellation capacitor is proposed. In addition, the coarse‐analogue‐to‐digital converter of the second stage is embedded into the amplification phase, which relaxes the comparison periods of the first and second stages by 25.0% and 17.4%, respectively. Post‐simulated in 28‐nm CMOS technology with a 0.9 V supply, the analogue‐to‐digital converter achieves 62.2 dB SNDR and 78.1 dB SFDR. It consumes 8.45 mW with an on‐chip reference voltage buffer, resulting in Schreier's figure of merit (FoM S ) of 166.9 dB.

Electronics LettersVol. 60(23)
Fudan University (CN), Shanghai Fudan Microelectronics (China) (CN), State Key Laboratory of ASIC and System
Affordable and clean energy
Openalex Percentile: Top 79%
Analog and Mixed-Signal Circuit Design
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