Comparative Analysis of Layer Thickness Measurement Methods for Photovoltaic Modules: A Comprehensive Study
Layer Thickness Measurement Methods for Photovoltaic Modules The image shows an optical setup that measures individual layers inside small single-cell photovoltaic test modules without contact. In the foreground, a 3D scan based on optical coherence tomography of a small section of the module is presented as a color map, clearly distinguishing individual layers such as the solar cell, grid fingers, busbars, and backsheet. More details can be found in article number 2400219 by Lukas Neumaier and co-workers.
Authors
- Gabriele C. Eder (ORCID: https://orcid.org/0000-0003-0397-8453)
- Lukas Neumaier (ORCID: https://orcid.org/0000-0001-7736-7298)
- Thomas Nigl (ORCID: https://orcid.org/0000-0001-9023-6495)
- Anika Gassner (ORCID: https://orcid.org/0009-0007-1053-5761)
- Martin De Biasio
Institutions
- University of Vienna (AT)
- TU Wien (AT)
- Montanuniversität Leoben (AT)
- Silicon Austria Labs (Austria) (AT)
- Österreichisches Forschungsinstitut für Chemie und Technik (AT)
Publication Details
- Journal
- Advanced Energy and Sustainability Research
- Published
- 2024-12-01
- DOI
- https://doi.org/10.1002/aesr.202470030
- Citations
- 1
- Primary Topic
- Silicon and Solar Cell Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.21