Investigation of Topography and Electrical Properties of K<sub>0.3</sub>MoO<sub>3</sub> Thin Films

Abstract In this article we investigate topography and electrical properties of potassium blue bronze thin films by the means of atomic force microscopy. Thin films were prepared by pulsed laser depositions on two types of substrates (Al 2 O 3 and SrTiO 3 ) at different substrate temperatures and partial oxygen pressures. On the basis of topography measurements, granular nature of the films was revealed. Surface roughness, as well as the size and the orientation of grains was determined. Films deposited on SrTiO 3 substrates are quite homogeneous and the grains display ordering in preferential directions. Films on Al 2 O 3 contain randomly oriented grains. Roughness of the films increases with the increase of the deposition temperature. Electrical measurements provided qualitative information regarding the electrical properties of the films.

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Publication Details

Journal
Journal of Physics Conference Series
Published
2024-12-01
DOI
https://doi.org/10.1088/1742-6596/2930/1/012006
Primary Topic
Electronic and Structural Properties of Oxides
Type
article
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article

Investigation of Topography and Electrical Properties of K0.3MoO3 Thin Films

Maja Đekić, Matjaž Spreitzer, Belma Husković
Journal of Physics Conference Series
Electronic and Structural Properties of Oxides
article

Investigation of Topography and Electrical Properties of K0.3MoO3 Thin Films

Maja Đekić, Matjaž Spreitzer, Belma Husković
article en

Abstract

Abstract In this article we investigate topography and electrical properties of potassium blue bronze thin films by the means of atomic force microscopy. Thin films were prepared by pulsed laser depositions on two types of substrates (Al 2 O 3 and SrTiO 3 ) at different substrate temperatures and partial oxygen pressures. On the basis of topography measurements, granular nature of the films was revealed. Surface roughness, as well as the size and the orientation of grains was determined. Films deposited on SrTiO 3 substrates are quite homogeneous and the grains display ordering in preferential directions. Films on Al 2 O 3 contain randomly oriented grains. Roughness of the films increases with the increase of the deposition temperature. Electrical measurements provided qualitative information regarding the electrical properties of the films.

Journal of Physics Conference SeriesVol. 2930(1)
University of Sarajevo (BA), University of Mostar (BA), Jožef Stefan Institute (SI)
Openalex Percentile: Top 86%
Electronic and Structural Properties of Oxides
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