Reliability Variation Assessment Due to Alteration in Subsystems of a Series-Parallel System under Weibull Failure Laws

Here, we consider a (m, ni) order system having 'm' number of subsystems connected in series and each subsystem has 'n' number of components in parallel. The reliability of the system has been obtained by deleting 'y' number of subsystems (or adding 'x' number of subsystems) from (or to) it. The variation in reliability due to alteration in subsystems has been assessed for a particular system of (4,3) order. A regression approach is used to quantify the strength of variation in reliability due to alteration in subsystems. The coefficient of determination (R2) and adjusted R2 are also obtained to examine the goodness of fit. The variation in reliability has been shown numerically and graphically for particular value of the parameters. The application of the present study can be visualized in an Internally Fused Shunt Capacitor Bank System (electrical system).. KEYWORDS :Reliability variations, Series-Parallel system, Internally fused shunt capacitor bank, Regression Analysis.