Development and testing of a dual-frequency real-time hardware feedback system for the hard X-ray nanoprobe beamline of the SSRF
A novel dual-frequency real-time feedback system has been developed to simultaneously optimize and stabilize beam position and energy at the hard X-ray nanoprobe beamline of the Shanghai Synchrotron Radiation Facility. A user-selected cut-off frequency is used to separate the beam position signal obtained from an X-ray beam position monitor into two parts, i.e. high-frequency and low-frequency components. They can be real-time corrected and optimized by two different optical components, one chromatic and the other achromatic, of very different inertial mass, such as Bragg monochromator dispersive elements and a pre-focusing total external reflection mirror. The experimental results shown in this article demonstrate a significant improvement in position and energy stabilities. The long-term beam angular stability clearly improved from 2.21 to 0.92 µrad RMS in the horizontal direction and from 0.72 to 0.10 µrad RMS in the vertical direction.
Authors
- Zhisen Jiang
- Hui Jiang (ORCID: https://orcid.org/0000-0002-4782-5072)
- Aiguo Li (ORCID: https://orcid.org/0000-0003-1977-2636)
- Riccardo Signorato
- Yan He (ORCID: https://orcid.org/0009-0006-0374-6352)
- Dongxu Liang
- Hang Yu
- Yinghua He
Institutions
- Università degli Studi del Piemonte Orientale “Amedeo Avogadro” (IT)
- Shanghai Advanced Research Institute (CN)
Publication Details
- Journal
- Journal of Synchrotron Radiation
- Published
- 2024-12-06
- DOI
- https://doi.org/10.1107/s1600577524010208
- Citations
- 2
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 1.22
Funders
- Natural Science Foundation of Shanghai
- National Natural Science Foundation of China
- National Key Research and Development Program of China