Inline Measurement of Light Beam Induced Current (LBIC) Under High-Injection and Reverse Bias Conditions

Quality control in solar cell production relies on characterization methods that are fast enough to yield information on the properties of each solar cell in less than about one second. Imaging techniques such as electroluminescence (EL) are well established methods revealing spatially resolved quality mappings. Scanning techniques such as light beam induced current (LBIC) are common laboratory methods yielding complementary information but do not meet the speed requirements. In our work, we analyse an inline implementation of the LBIC method which is extended with respect to its measurement parameters, i.e., both the laser power and a solar cell bias-voltage are varied. As these extended conditions differ from conventional LBIC-applications at zero bias and low injection, we compare our inline-LBIC images with EL images and conventional LBIC images by means of an image contrast analysis. We find that our method resembles more the EL imaging as variations in the local series resistance are prominently detected. Thus, the proposed LBIC approach with extended measurement parameter range can yield both local short circuit information and local series resistance information. With our setup, measurement speeds around 700 ms are achieved.