Evaluation and Characterization of 650-V Bidirectional GaN Devices
This paper presents the evaluation of a 650-V bidirectional GaN device for static characteristics and dynamic performance in high $d v / d t$ and $d i / d t$ operations. The device evaluation becomes challenging due to its unique structure and characteristics. The static characterization of the 650-V GaN is described, including the evaluation setup and design considerations. Using the proposed static evaluation setup, the device I-V curves and C-V curves for both directions are evaluated. The bidirectional switch dynamic evaluation setup is also illustrated for its principles and optimization considerations for managing high $d v / d t$ and $d i / d t$. The dynamic evaluation results demonstrate the bidirectional GaN device’s symmetrical dynamic characteristics, achieving a peak $d v / d t$ of 94.1 V/ns and a peak $d i / d t$ of 5.01 A/ns.
Authors
- Jacob Mueller (ORCID: https://orcid.org/0000-0001-6173-0283)
- Junchong Fan
- Jin Wang (ORCID: https://orcid.org/0000-0002-1594-8457)
- Pengyu Fu (ORCID: https://orcid.org/0000-0002-4251-8209)
- Stanley Atcitty (ORCID: https://orcid.org/0000-0002-3208-0880)
- Luciano Garcia Rodriguez (ORCID: https://orcid.org/0000-0002-4608-2940)
- Yizhou Cong (ORCID: https://orcid.org/0000-0002-2656-4547)
- Zhining Zhang (ORCID: https://orcid.org/0000-0002-1202-2333)
Institutions
- Sandia National Laboratories (US)
- The Ohio State University (US)
Publication Details
- Published
- 2024-11-04
- DOI
- https://doi.org/10.1109/wipda62103.2024.10773040
- Citations
- 3
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.93
Funders
- U.S. Department of Energy
- Advanced Research Projects Agency