Sneak Circuit Analysis Covering Interface Circuits in Spacecraft Integrated Chips while Considering Faults
Sneak circuit analysis is a crucial reliability design process. In the design of spacecraft electronic systems, it is challenging to identify sneak circuits related to integrated chip interface circuits, and there are few targeted researches. In extreme working conditions, the coupling sneak circuits caused by the failure of integrated chips are difficult to identify, affecting the design optimization. The paper proposes a typical interface information specification model for integrated chips to simulate the electrical information characteristics of interfaces. And the typical failure models of intrinsic components inside the chip are determined through multi-physics field analysis. Then, based on the digital model, a sneak circuit diagnosis process based on excitation and fault injection are proposed, and a sneak circuit screening method based on Python virtual prototyping is implemented in the case study. Finally, the design constraint clues for the chip’s external circuit are obtained, which provides a reference for related fault diagnosis and reliability optimization works.
Authors
- Mingtao Feng (ORCID: https://orcid.org/0000-0003-0384-3743)
- Guofu Zhai (ORCID: https://orcid.org/0000-0003-1026-6024)
- Cen Chen (ORCID: https://orcid.org/0000-0002-5115-4929)
- Weiming Liu (ORCID: https://orcid.org/0009-0003-2699-3696)
- Haonan Zhang (ORCID: https://orcid.org/0000-0002-4239-6141)
- Kaiwen Xiao (ORCID: https://orcid.org/0009-0007-4376-865X)
Institutions
- Harbin Institute of Technology (CN)
- Beijing Aerospace Flight Control Center (CN)
Publication Details
- Published
- 2024-10-11
- DOI
- https://doi.org/10.1109/srse63568.2024.10772492
- Citations
- 1
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.21