Design of Accelerated Reliability Validation Plan for Smart Electrical Energy Meters under Time-Varying Environments

To address the challenge of validating high-quality and long-lifetime products, this study developed a model that accounts for accelerated degradation under typical time-varying environments. Utilizing data from test bases and field operations in a certain region, a model was constructed to describe the impact of temperature stress on the lifespan of smart meters over time. The Arrhenius model was employed to create an acceleration model for time-varying temperatures influencing the lifespan of the smart electrical energy meters, enabling the determination of activation energy and dynamic acceleration factors under two distinct time-varying environmental conditions. Leveraging these acceleration factors, an accelerated reliability acceptance plan was designed specifically for smart electrical energy meters with Weibull-distributed lifetimes under time-varying stress conditions.