Inter-valley phonon scattering limited performance of n-channel WS<sub>2</sub> monolayer transistors

Abstract In addition to the K conduction band valley of monolayer WS 2 , there is a remote Q valley located 0.1 eV above the K valley. We investigate the effects of intra- and inter-valley phonon scattering, including <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">↔</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley scattering, on monolayer WS 2 device performance using a recursive Green’s function algorithm and the Büttiker probe scattering model. Our analysis reveals that ballisticity drops to 54% when only intra-valley phonon scattering is considered. When inter-valley phonon scattering (excluding <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">↔</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley scattering) is added, ballisticity decreases to 42%. This further declines to 12% with the inclusion of <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">↔</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley scatterings. Similarly, low-field mobility values decrease successively from 395 cm <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:msup> <mml:mrow/> <mml:mn>2</mml:mn> </mml:msup> <mml:msup> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mtext>V</mml:mtext> <mml:mo>⋅</mml:mo> <mml:mtext>s</mml:mtext> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> <mml:mrow> <mml:mo>−</mml:mo> <mml:mn>1</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> to 223 cm <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:msup> <mml:mrow/> <mml:mn>2</mml:mn> </mml:msup> <mml:msup> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mtext>V</mml:mtext> <mml:mo>⋅</mml:mo> <mml:mtext>s</mml:mtext> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> <mml:mrow> <mml:mo>−</mml:mo> <mml:mn>1</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> and then to 110 cm <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:msup> <mml:mrow/> <mml:mn>2</mml:mn> </mml:msup> <mml:msup> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mtext>V</mml:mtext> <mml:mo>⋅</mml:mo> <mml:mtext>s</mml:mtext> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> <mml:mrow> <mml:mo>−</mml:mo> <mml:mn>1</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> at a sheet density of 10 9 cm −2 . The primary scattering mechanism responsible for this degradation is <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">→</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley acoustic phonon scattering, characterized by a high deformation potential of <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mn>7.3</mml:mn> <mml:mo>×</mml:mo> <mml:msup> <mml:mn>10</mml:mn> <mml:mn>8</mml:mn> </mml:msup> <mml:msup> <mml:mrow> <mml:mi>eV</mml:mi> <mml:mstyle scriptlevel="0"/> <mml:mi>cm</mml:mi> </mml:mrow> <mml:mrow> <mml:mo>−</mml:mo> <mml:mn>1</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> and a low energy of 16.76 meV. Additionally, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">→</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley scattering significantly populates the Q valley, which presents a higher potential barrier in the on-state conduction band profile, resulting in a lower on-state current. Our analysis shows that approximately 40% of the on-state total power dissipated within the device is due to phonon scattering effects, with the remainder being released through thermalization in the device’s contacts.

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Semiconductor Science and Technology
Published
2024-12-06
DOI
https://doi.org/10.1088/1361-6641/ad9b49
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GaN-based semiconductor devices and materials
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article
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article

Inter-valley phonon scattering limited performance of n-channel WS2 monolayer transistors

Khairul Alam
Semiconductor Science and Technology
GaN-based semiconductor devices and materials
article

Inter-valley phonon scattering limited performance of n-channel WS2 monolayer transistors

Khairul Alam
article en

Abstract

Abstract In addition to the K conduction band valley of monolayer WS 2 , there is a remote Q valley located 0.1 eV above the K valley. We investigate the effects of intra- and inter-valley phonon scattering, including <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">↔</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley scattering, on monolayer WS 2 device performance using a recursive Green’s function algorithm and the Büttiker probe scattering model. Our analysis reveals that ballisticity drops to 54% when only intra-valley phonon scattering is considered. When inter-valley phonon scattering (excluding <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">↔</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley scattering) is added, ballisticity decreases to 42%. This further declines to 12% with the inclusion of <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">↔</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley scatterings. Similarly, low-field mobility values decrease successively from 395 cm <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:msup> <mml:mrow/> <mml:mn>2</mml:mn> </mml:msup> <mml:msup> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mtext>V</mml:mtext> <mml:mo>⋅</mml:mo> <mml:mtext>s</mml:mtext> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> <mml:mrow> <mml:mo>−</mml:mo> <mml:mn>1</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> to 223 cm <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:msup> <mml:mrow/> <mml:mn>2</mml:mn> </mml:msup> <mml:msup> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mtext>V</mml:mtext> <mml:mo>⋅</mml:mo> <mml:mtext>s</mml:mtext> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> <mml:mrow> <mml:mo>−</mml:mo> <mml:mn>1</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> and then to 110 cm <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:msup> <mml:mrow/> <mml:mn>2</mml:mn> </mml:msup> <mml:msup> <mml:mrow> <mml:mo stretchy="false">(</mml:mo> <mml:mtext>V</mml:mtext> <mml:mo>⋅</mml:mo> <mml:mtext>s</mml:mtext> <mml:mo stretchy="false">)</mml:mo> </mml:mrow> <mml:mrow> <mml:mo>−</mml:mo> <mml:mn>1</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> at a sheet density of 10 9 cm −2 . The primary scattering mechanism responsible for this degradation is <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">→</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley acoustic phonon scattering, characterized by a high deformation potential of <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mn>7.3</mml:mn> <mml:mo>×</mml:mo> <mml:msup> <mml:mn>10</mml:mn> <mml:mn>8</mml:mn> </mml:msup> <mml:msup> <mml:mrow> <mml:mi>eV</mml:mi> <mml:mstyle scriptlevel="0"/> <mml:mi>cm</mml:mi> </mml:mrow> <mml:mrow> <mml:mo>−</mml:mo> <mml:mn>1</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> and a low energy of 16.76 meV. Additionally, <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mrow> <mml:mi>K</mml:mi> <mml:mo stretchy="false">→</mml:mo> <mml:mi>Q</mml:mi> </mml:mrow> </mml:math> inter-valley scattering significantly populates the Q valley, which presents a higher potential barrier in the on-state conduction band profile, resulting in a lower on-state current. Our analysis shows that approximately 40% of the on-state total power dissipated within the device is due to phonon scattering effects, with the remainder being released through thermalization in the device’s contacts.

Semiconductor Science and TechnologyVol. 40(1)
East West University (BD)
Openalex Percentile: Top 86%
GaN-based semiconductor devices and materials
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