Rethinking Coherent Diffraction Instruments for High Brightness Sources

Abstract Over the past two decades, exceptional progress has been made providing coherent x-ray beams at both high-brightness synchrotron sources and x-ray free electron lasers (XFEL). The availability of these coherent x-rays has led to a surge in instruments that exploit x-ray coherence for either x-ray photon correlation spectroscopy (XPCS) or coherent diffraction imaging (CDI). A key to these techniques has been to resolve, or at least nearly resolve, the speckles associated with the scattering from structural disorder. Given practical limits on detector pixel size, this requires long sample-to-detector distances. This paper presents numerical simulations of an instrument that can efficiently provide a long sample-detector distance while maintaining the ability to rapidly set momentum transfer by inserting crystals with different order in the incident beam, thus changing in incident direction instead of moving the detector.