Growth mechanism of Pb<sub>0.9</sub>Cd<sub>0.1</sub>Te: Pb thin films prepared by PVD technique
Abstract The complex surface morphology, defect subsystem and an ab initio model study of Pb 1-x Cd x Te thin films deposited on mica-muscovite substrates by PVD technology are presented in this paper. The thickness, growth mechanisms and uniformity of condensates dependence on deposition regimes were studied by scanning electron microscopy and energy-dispersive x-ray spectroscopy. The deposited films have a granular structure and sizes of crystallites depend on thickness and difference between substrate and condensate crystallographic parameters. The dominance of film growth by the Vollmer-Weber mechanism is demonstrate. Studies of film growth mechanisms allowed us to predict that the formation of grains and the dynamics of their size changes during film growth are caused by complex defects that are associated with Cd atoms in nodes and vacancies of chalcogens.
Authors
- Тетяна Мазур (ORCID: https://orcid.org/0000-0002-4047-832X)
- Taras Parashchuk (ORCID: https://orcid.org/0000-0003-1780-0410)
- B.P. Naidych (ORCID: https://orcid.org/0000-0001-5363-1592)
- L.I. Nykyruy (ORCID: https://orcid.org/0000-0002-3754-0348)
- R. Yavorskyi (ORCID: https://orcid.org/0000-0001-5690-7486)
- O. Voznyak (ORCID: https://orcid.org/0000-0002-7109-9752)
- O.V. Zamurujeva
- Oksana Holovata
Institutions
- University of Agriculture in Krakow (PL)
- Lesya Ukrainka Volyn National University (UA)
- Ivano-Frankivsk National Technical University of Oil and Gas (UA)
- Vasyl Stefanyk Carpathian National University (UA)
- AGH University of Krakow (PL)
Publication Details
- Journal
- Nano Express
- Published
- 2024-12-01
- DOI
- https://doi.org/10.1088/2632-959x/ad9abf
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00