Corrections to “Diamond-on-Si IGBT With Ultrahigh Breakdown Voltage and On-State Current”

Presents corrections to the paper, (Corrections to “Diamond-on-Si IGBT With Ultrahigh Breakdown Voltage and On-State Current”).

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Publication Details

Journal
IEEE Transactions on Electron Devices
Published
2024-12-01
DOI
https://doi.org/10.1109/ted.2024.3494760
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
0.00
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article

Corrections to “Diamond-on-Si IGBT With Ultrahigh Breakdown Voltage and On-State Current”

Chengchang Zhang, Jun Ying, Guangyu Wang, Zhi Jiang et al.
IEEE Transactions on Electron Devices
Silicon Carbide Semiconductor Technologies
article

Corrections to “Diamond-on-Si IGBT With Ultrahigh Breakdown Voltage and On-State Current”

Chengchang Zhang, Jun Ying, Guangyu Wang, Zhi Jiang, Yu Pang, Jiajia Du, Enpu Wang
article en

Abstract

Presents corrections to the paper, (Corrections to “Diamond-on-Si IGBT With Ultrahigh Breakdown Voltage and On-State Current”).

IEEE Transactions on Electron DevicesVol. 71(12)
Chongqing University of Posts and Telecommunications (CN), University of Aveiro (PT)
Openalex Percentile: Top 80%
Silicon Carbide Semiconductor Technologies
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Corrections to “Diamond-on-Si IGBT With Ultrahigh Breakdown Voltage and On-State Current” — Chengchang Zhang, Jun Ying, et al. · IEEE Transactions on Electron Devices (2024) | TGRS Research Map | TGRS