Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation

Fault injection attacks (FIAs) induce hardware failures in circuits and exploit these faults to compromise the security of the system. It has been demonstrated that FIAs can bypass system security mechanisms, cause faulty outputs, and gain access to secret information. Certain types of FIAs can be mounted with little effort by tampering with clock signals and/or the chip’s operating conditions. To mitigate such low-cost, yet powerful attacks, we propose a fully synthesizable and distributable in situ fault injection monitor that employs a delay locked loop (DLL) to track the pulsewidth of the clock. We further develop a fully automated design framework to optimize and implement the FIA monitors at any process node. Our design is fabricated and verified in 65-nm CMOS technology with a small footprint of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1500~{\mu }$ </tex-math></inline-formula>m2. It can lock to clock frequencies from 2 MHz to 1.26 GHz while detecting all 12 types of possible clock glitches, as well as timing FIA injections via the supply voltage, electromagnetic (EM) signals, and chip temperature.

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Publication Details

Journal
IEEE Journal of Solid-State Circuits
Published
2024-12-04
DOI
https://doi.org/10.1109/jssc.2024.3504546
Citations
1
Primary Topic
Radiation Effects in Electronics
Type
article
Field-Weighted Citation Impact
0.21
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article

Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation

Kaiyuan Yang, Yan He, Yumin Su
1 citations
IEEE Journal of Solid-State Circuits
Radiation Effects in Electronics
0.21
article

Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation

Kaiyuan Yang, Yan He, Yumin Su
article en
1 citations

Abstract

Fault injection attacks (FIAs) induce hardware failures in circuits and exploit these faults to compromise the security of the system. It has been demonstrated that FIAs can bypass system security mechanisms, cause faulty outputs, and gain access to secret information. Certain types of FIAs can be mounted with little effort by tampering with clock signals and/or the chip’s operating conditions. To mitigate such low-cost, yet powerful attacks, we propose a fully synthesizable and distributable in situ fault injection monitor that employs a delay locked loop (DLL) to track the pulsewidth of the clock. We further develop a fully automated design framework to optimize and implement the FIA monitors at any process node. Our design is fabricated and verified in 65-nm CMOS technology with a small footprint of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1500~{\mu }$ </tex-math></inline-formula>m2. It can lock to clock frequencies from 2 MHz to 1.26 GHz while detecting all 12 types of possible clock glitches, as well as timing FIA injections via the supply voltage, electromagnetic (EM) signals, and chip temperature.

IEEE Journal of Solid-State CircuitsVol. 60(1)
Rice University (US)
Openalex Percentile: Top 45%
Radiation Effects in Electronics
0.21
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