A 2-mW 70.7-dB SNDR 200-MS/s Pipelined-SAR ADC Using Continuous-Time SAR-Assisted Detect-and-Skip and Open-Then-Close Correlated Level Shifting

This work presents a 2-mW 70.7-dB SNDR 200-MS/s pipelined-successive-approximation-register (SAR) analog-to-digital converter (ADC) with a continuous-time SAR-assisted detect-and-skip (CTDAS) and open-then-close correlated level shifting (OCCLS). In the first-stage SAR ADC, we propose using the continuous-time SAR (CTSAR) as the coarse SAR ADC in the detect-and-skip (DAS) scheme, thus parallelizing MSB conversion with ADC sampling. Furthermore, in the residue amplifier (RA), an OCCLS technique is proposed, which significantly speeds up the first correlated level shifting (CLS) phase by open-loop amplification and consequently enhances the equivalent open-loop gain at negligible extra time cost. An on-chip background self-detect-and-cut loop is used for the OCCLS to attain a PVT-robust high equivalent open-loop gain. For RA implementation, a hybrid static-floating ring-amp structure is adopted to improve the noise performance while fitting in well with the OCCLS scheme. Thanks to the proposed techniques, the 22-nm prototype achieves 70.7-dB SNDR under 200 MS/s while consuming only 2.0 mW from a 0.9-V supply. It measures 177.7-dB FoMs, which is the highest among ADCs with equivalent or higher sampling rates.

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Publication Details

Journal
IEEE Journal of Solid-State Circuits
Published
2024-12-04
DOI
https://doi.org/10.1109/jssc.2024.3497175
Citations
2
Primary Topic
CCD and CMOS Imaging Sensors
Type
article
Field-Weighted Citation Impact
0.42

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article

A 2-mW 70.7-dB SNDR 200-MS/s Pipelined-SAR ADC Using Continuous-Time SAR-Assisted Detect-and-Skip and Open-Then-Close Correlated Level Shifting

Le Ye, Siyuan Ye, Jiajia Cui, Ru Huang et al.
2 citations
IEEE Journal of Solid-State Circuits
CCD and CMOS Imaging Sensors
0.42
article

A 2-mW 70.7-dB SNDR 200-MS/s Pipelined-SAR ADC Using Continuous-Time SAR-Assisted Detect-and-Skip and Open-Then-Close Correlated Level Shifting

Le Ye, Siyuan Ye, Jiajia Cui, Ru Huang, Xinhang Xu, Zhuoyi Chen, Jihang Gao, Linxiao Shen, Jie Li, Xing Zhang, Yaohui Luan
article en
2 citations

Abstract

This work presents a 2-mW 70.7-dB SNDR 200-MS/s pipelined-successive-approximation-register (SAR) analog-to-digital converter (ADC) with a continuous-time SAR-assisted detect-and-skip (CTDAS) and open-then-close correlated level shifting (OCCLS). In the first-stage SAR ADC, we propose using the continuous-time SAR (CTSAR) as the coarse SAR ADC in the detect-and-skip (DAS) scheme, thus parallelizing MSB conversion with ADC sampling. Furthermore, in the residue amplifier (RA), an OCCLS technique is proposed, which significantly speeds up the first correlated level shifting (CLS) phase by open-loop amplification and consequently enhances the equivalent open-loop gain at negligible extra time cost. An on-chip background self-detect-and-cut loop is used for the OCCLS to attain a PVT-robust high equivalent open-loop gain. For RA implementation, a hybrid static-floating ring-amp structure is adopted to improve the noise performance while fitting in well with the OCCLS scheme. Thanks to the proposed techniques, the 22-nm prototype achieves 70.7-dB SNDR under 200 MS/s while consuming only 2.0 mW from a 0.9-V supply. It measures 177.7-dB FoMs, which is the highest among ADCs with equivalent or higher sampling rates.

IEEE Journal of Solid-State CircuitsVol. 60(7)
Peking University (CN)
National Natural Science Foundation of China, Higher Education Discipline Innovation Project
Affordable and clean energy
Openalex Percentile: Top 36%
CCD and CMOS Imaging Sensors
0.42
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