Electrical Stress on Semiconductor Devices Mounted on <scp>PCB</scp> during Electrostatic Elimination by Corona Discharge Ionizer
Semiconductor devices mounted on printed circuit boards may be damaged by electrical stresses based on induced voltages due to the electric field generated by corona discharge ionizers during the static elimination, because the input line connected to the semiconductor device acts as an antenna terminating the electric field. An electrical stress sensor using an operational amplifier with an input line was mounted on a printed circuit board, in order to investigate the input line length dependence of the electrical stress due to the electric field by the ionizer. The results showed that recent scaled‐down semiconductor devices may be damaged when the length of the input line exceeds 50 mm during static elimination with the corona discharge ionizer. © 2024 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.
Authors
- Makoto Okano
- Aguri Nakano
- Takashi Terashige
Institutions
- Sanyo (Japan) (JP)
- National Institute of Technology Okinawa College (JP)
- Hiroshima International University (JP)
Publication Details
- Journal
- IEEJ Transactions on Electrical and Electronic Engineering
- Published
- 2024-12-04
- DOI
- https://doi.org/10.1002/tee.24245
- Primary Topic
- Electrostatic Discharge in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00