Electrical Stress on Semiconductor Devices Mounted on <scp>PCB</scp> during Electrostatic Elimination by Corona Discharge Ionizer

Semiconductor devices mounted on printed circuit boards may be damaged by electrical stresses based on induced voltages due to the electric field generated by corona discharge ionizers during the static elimination, because the input line connected to the semiconductor device acts as an antenna terminating the electric field. An electrical stress sensor using an operational amplifier with an input line was mounted on a printed circuit board, in order to investigate the input line length dependence of the electrical stress due to the electric field by the ionizer. The results showed that recent scaled‐down semiconductor devices may be damaged when the length of the input line exceeds 50 mm during static elimination with the corona discharge ionizer. © 2024 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.

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Publication Details

Journal
IEEJ Transactions on Electrical and Electronic Engineering
Published
2024-12-04
DOI
https://doi.org/10.1002/tee.24245
Primary Topic
Electrostatic Discharge in Electronics
Type
article
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article

Electrical Stress on Semiconductor Devices Mounted on PCB during Electrostatic Elimination by Corona Discharge Ionizer

Makoto Okano, Aguri Nakano, Takashi Terashige
1 links
IEEJ Transactions on Electrical and Electronic Engineering
Electrostatic Discharge in Electronics
article

Electrical Stress on Semiconductor Devices Mounted on PCB during Electrostatic Elimination by Corona Discharge Ionizer

Makoto Okano, Aguri Nakano, Takashi Terashige
article en

Abstract

Semiconductor devices mounted on printed circuit boards may be damaged by electrical stresses based on induced voltages due to the electric field generated by corona discharge ionizers during the static elimination, because the input line connected to the semiconductor device acts as an antenna terminating the electric field. An electrical stress sensor using an operational amplifier with an input line was mounted on a printed circuit board, in order to investigate the input line length dependence of the electrical stress due to the electric field by the ionizer. The results showed that recent scaled‐down semiconductor devices may be damaged when the length of the input line exceeds 50 mm during static elimination with the corona discharge ionizer. © 2024 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.

IEEJ Transactions on Electrical and Electronic EngineeringVol. 20(6)
Sanyo (Japan) (JP), National Institute of Technology Okinawa College (JP), Hiroshima International University (JP)
Affordable and clean energy
Openalex Percentile: Top 80%
Electrostatic Discharge in Electronics
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