Etching properties of PIN-PMN-PT and its integration in electro-optic phase modulators
We investigate the etching characteristics of PIN-PMN-PT crystals, exploring various wet etching solutions, reactive ion etching gases, and ion beam etching. The etch rate and surface roughness are systematically measured for each method. A process flow to obtain PIN-PMN-PT thin films is described and performed to later build a single-mode rib waveguide. An integrated electro-optic phase modulator is fabricated by depositing electrodes on the sides of the waveguides. The electro-optic coefficient implied in our phase modulators is r 51 / r 42 . The performances are tested achieving a V π L of 19.2 V·cm.
Authors
- Yves-Alain Peter (ORCID: https://orcid.org/0000-0003-4528-3596)
- Nicolás Quesada (ORCID: https://orcid.org/0000-0002-0175-1688)
Publication Details
- Journal
- Optical Materials Express
- Published
- 2024-12-04
- DOI
- https://doi.org/10.1364/ome.542571
- Primary Topic
- Nonlinear Optical Materials Research
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Natural Sciences and Engineering Research Council of Canada